Lens Body Design Of High Resolution Atomic Force Microscopy Based On Stm

Han Xianwu,Chen Xiaoan,Yang Xueheng
2006-01-01
Abstract:Atomic Force Microscopy (AFM) has become an important instrument in nano-measurement and nano-machining because it has no demands for electrical conductivity of sample surface. In this paper, the special design, resolution analysis and characteristic of the lens body of Atomic Force Microscopy Institute of Particle Physics (AFM.IPC-208B) are introduced in detail. AFM.IPC-208B uses a tunneling tip to detect the fluctuation of the AFM cantilever, and four step motors and two piezoelectric ceramics tubes are used to enlarge its scanning range and to enhance its resolution. Finally STM three-dimensional image of HOPG surface in the STM mode and AFM two-dimensional image of mica surface in the AFM mode show that AFM.IPC-208B can achieve the atomic-level resolution.
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