A Compatible Atomic Force and ScanningTunneling Microscope System

Chuangshe Li,Jianping Song,Shi Li,Tiantong Tang
DOI: https://doi.org/10.3321/j.issn:0253-987X.1999.05.003
1999-01-01
Abstract:Scanning tunneling microscope (STM) and atomic force microscope (AFM) have been widely used in the fields of surface physics, chemistry, biology etc., because they both yield resolution at the atomic scale level. The former requires the samples to be conductive while the latter applies to both conductive and nonconductive samples. The proposed system could replace with STM and AFM with nano-scale resolution while further refinement can be made to include the atomic level.
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