Abstract:Electron-induced secondary electron (SE) emission from space insulating materials is a very important factor in understanding spacecraft charging behavior. Because of the injection of primary electrons (PEs) and the emission of SEs in the surface layer of insulating materials, the target surface can be either negatively or positively charged. In the conventional measurement methods, a single short, low-density pulsed e-beam, charge neutralization using low energy flood e-gun and UV light, and charge dissipation by heating is used. In this paper, a pulsed scanning method for the total electron emission yield measurement of insulating, semiconducting or conducting solid materials is proposed. A total electron detector with large hollow space and insulating spacer was designed, and a pulsed yield scanning measurement system was developed. This method can avoid influence from the charged surface of the insulating material. Using the system, the total SE emission yields of 200 nm thick Au coating on glass, and 11 kinds of solar cell coverglasses and optical solar reflectors produced by Qioptiq have been reported, as induced by a 30 mu s pulse of PEs with similar to 20 nA incident beam current and energies up to 2500 eV.

Slow Highly Charged Ion O4+ Induced Electron Emission From Clean Solid Surfaces

Slow Highly Charged Ions Induced Electron Emission from Clean Si Surfaces

Electron Emission Induced by the Interaction of Highly Charged Ions 207pbq+(24≤q≤36) with Solid Surface of Si(110)

Contribution from recoiling atoms in secondary electron emission induced by slow highly charged ions from tungsten surface

The Electron Emission Yield Induced by the Interaction of Highly Charged Argon Ions with Silicon Surface

Studies on Kinetic Electron Emission from the Interaction of Slow Multi-Charged He~(2+),O~(2+) and He~(2+) Ions with W Surface

Secondary Electron Emission from Carbon Foils under O2+ Ion Impact

Electron emission and surface etching by slow and medium highly charged ions on HOPG surface

200 Nm–1000 Nm Spectra of Light Emitted in the Impact of 40 Ar 10+ Upon Al and Si Solid Surfaces

Electron Emission from Tungsten Surface Induced by Neon Ions

Electron emission by highly charged neon and xenon ions on fusion-relevant tungsten and graphite surfaces

Total Electron Emission Yield of Solar Cell Coverglass and Optical Solar Reflector

Study of the interaction of highly charged ions with surfaces

Charge effect in secondary electron emission from silicon surface induced by slow neon ions

XPS Studies of Charging Effect Induced by X-ray Irradiation on Amorphous SiO2 Thin Films

Surface Plasmon-Assisted Excitation of Atomic Visible Light Spectral Lines in the Impact of Highly Charged Ions 126xeq+ on Solid Surfaces

Separation of potential and kinetic electron emission from Si and W induced by multiply charged neon and argon ions

Study of Channeling Effect by Impact of Highly Charged Ions on Crystal Surface of Si(110)

Relativistic Laser Acceleration of Electrons along Solid Surfaces

Potential Sputtering by Highly Charged Ion Bombardment on Au Surface

Highly Charged Ions Interaction with Surface