Surface-Emission Studies in a High-Field RF Gun Based on Measurements of Field Emission and Schottky-Enabled Photoemission

H. Chen,Y. Du,W. Gai,A. Grudiev,J. Hua,W. Huang,J. G. Power,E. E. Wisniewski,W. Wuensch,C. Tang,L. Yan,Y. You

DOI: https://doi.org/10.1103/physrevlett.109.204802

IF: 8.6

2012-01-01

Physical Review Letters

Abstract:We report on investigations into the fundamental surface emission parameters, the geometric field enhancement factor (beta) and the work function (phi), by making both field emission and Schottky-enabled photoemission measurements. The measurements were performed on a copper surface in the Tsinghua University S-band RF gun in two separate experiments. Fitting our data to the models for each experiment indicate that the traditionally assumed high value of beta(approximate to 50-500) does not provide a plausible explanation of the data, but incorporating a low value of phi at some sites does. In addition, direct measurements of the surface conducted after the experiment show that beta is on the order of a few, consistent with our understanding of the electron emission measurements. Thus we conclude that the dominant source of electron emission in high gradient RF cavities is due to low phi sites, as opposed to the conventionally assumed high beta sites. The origin of low phi at these sites is unclear and should be the subject of further investigation.