Integrated Ultrahigh-Sensitivity Temperature Sensor Based on Asymmetric Mach–Zehnder Interferometer and Stress Deformation of Aluminum-SiO2

Rui Yin,Longdu Liu,Qingjie Huang,Lin Lu,Hongliang Yang,Fengyu Liu,Pengcheng Liu,Wei Ji,Shouzhen Jiang,Jingwen Sun,Xiaojie Yin,Xiaohua Su
DOI: https://doi.org/10.1109/tim.2021.3115206
IF: 5.6
2021-01-01
IEEE Transactions on Instrumentation and Measurement
Abstract:This article proposes an integrated high-sensitivity temperature sensor based on SiO2-asymmetric Mach–Zehnder interferometer (AMZI) and thermal-expansion-induced stress of aluminum-SiO2. Mechanical analysis of this structure is carried out. The result shows that the SiO2 chip is compressed, and the waveguide length is decreased, leading to the central wavelength shift of the sensor. The sensitivity of the sensor can be customized by different arm lengths of the AMZI. The chip is fabricated using a standard planar lightwave circuit (PLC), and the aluminum alloy plate is glued to the chip using $\alpha $ -cyanaloc acrylic resin adhesive. The sensitivities of two sensors with different arm lengths are tested. The test results show the sensitivity reaches 6.86 and 54.2 nm $\cdot \text{K}^{-1}$ , respectively, which coincides with the theoretical analysis. With low cost and customizable sensitivity, this new device is applicable in many fields.
What problem does this paper attempt to address?