Visualizing Band Profiles of Gate-Tunable Junctions in MoS2/WSe2 Heterostructure Transistors.

Xinzuo Sun,Yan Chen,Zhiwei Li,Yu Han,Qin Zhou,Binbin Wang,Takashi Taniguchi,Kenji Watanabe,Aidi Zhao,Jianlu Wang,Yuan Liu,Jiamin Xue
DOI: https://doi.org/10.1021/acsnano.1c05491
IF: 17.1
2021-01-01
ACS Nano
Abstract:Heterostructure devices based on two-dimensional materials have been under intensive study due to their intriguing electrical and optical properties. One key factor in understanding these devices is their nanometer-scale band profiles, which is challenging to obtain in devices. Here, we use a technique named contact-mode scanning tunneling spectroscopy to directly visualize the band profiles of MoS2/WSe2 heterostructure devices at different gate voltages with nanometer resolution. The long-held view of a conventional p-n junction in the MoS2/WSe2 heterostructure is reexamined. Due to strong inter- and intralayer charge transfer, the MoS2 layer in contact with WSe2 is found to convert from n-type to p-type, and a series of gate-tunable p-n and p-p+ junctions are developed in the devices. Highly conductive edges are also discovered which could strongly affect the device properties.
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