Nano-wire in-situ stretching device in scanning electron microscope and method therefor

Xiaodong Han,Yuefei Zhang,Ze Zhang
2007-01-01
Abstract:The invention relates to a scanning electron microscope nanometer line original tensile device and method. It controls the heater to make the dual metal plate bending, drive slide of dual metal plate moving linearly along the track to both sides, tensile the nanometer line fastened on the sample bench, recording the tensile acted plastic tensile deformation and fracture failure, matching the dynamic performance of the nanometer line and the microstructure change, revealing the tensile deformation mechanism, fracture failure mode, brittle-ductile transition and so on of one dimension nanometer dynamic performance. It is simple, easy to control, realizing the original position one line measurement of the nanometer line dynamic feature.
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