Amorphous ZrO2 Tunnel Junction Memristor with a Tunneling Electroresistance Ratio above 400

Fenning Liu,Yue Peng,Yan Liu,Genquan Han,Wenwu Xiao,Bobo Tian,Ni Zhong,Hui Peng,Chungang Duan,Yue Hao
DOI: https://doi.org/10.1109/led.2021.3069837
IF: 4.8157
2021-01-01
IEEE Electron Device Letters
Abstract:An amorphous ZrO2 based tunneling junction memristor (TJM) with a tunneling electroresistance (TER) ratio above 400 is demonstrated. It is attributed to the modulation of tunneling barrier width induced by the accumulation of oxygen vacancies (V-O(+)) and negative charges near the ZrO2/semiconductor interface. The ferroelectric-like behaviors attributed to the voltage-modulated switching of the dipoles consisting of V-O(+) and negative charges in ZrO2 are characterized by a polarization-voltage test. The ZrO2 TJM achieves a TER ratio above 400 under 2.5/-1.5 V at 100 ns write/erase pulse condition, over 10(4) cycles program/erase endurance, and >10(4) s data retention.
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