Temperature-Dependent Fatigue Failure of Flexible Poly(9,9-dioctylfluorene-alt-benzothiadiazole) (pfbt)–zno Nanoparticle Hybrid Resistive Switching Memory Devices

Pei-Lun Yu,Wen Sui,Jian-Chang Li
DOI: https://doi.org/10.1021/acs.jpcc.0c07068
2020-01-01
Abstract:Polymer-nanoparticle (NP) hybrid nanocomposites act as essential elements for ultraflexible memory devices due to their processability, flexibility, and chemical resistance. However, a key limitation to their potential is associated with their mechanical reliability with the variation of temperature, which is still poorly understood. Herein, we systematically investigated the temperature-dependent fatigue failure of the Al/poly(9,9-dioctylfluorene-altbenzothiadiazole)-ZnO/Al/PET device, in which an 80% reduction in the fatigue lifetime of the device was observed as the temperature decreased from 40 to -40 degrees C. The finite element analysis results and theoretical calculations indicated that polymer/NP interfaces play different roles in crack propagations at different temperatures. At relatively high temperature, the elastic mismatch at the polymer/NP interface allows it to alleviate the crack propagation encountered with repetitive mechanical stress. However, this behavior is suppressed by the significant decrease of the polymer critical strain induced by the segmental motion in the polymer backbone at low temperature. In this case, large stiffness mismatch at the polymer/NP interface accelerates the crack propagation, which will inhibit electron transfer and eventually lead to device breakdown. This study may pave the way for future realization of ultraflexible hybrid memory devices utilized in harsh environments.
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