STUDY ON SCANNING MODE OF SCANNING TUNNELING MICROSCOPE

Xing Fu,Xiao-lei WEI,Xiao-tang HU
DOI: https://doi.org/10.3969/j.issn.0493-2137.2001.03.008
2001-01-01
Abstract:Based on the study on the scanning mode of STM,the “Coincidence Scanning Mode”is described in this paper.This mode can not only anoid the error in theory of probe but also reduce the scanning time by 70%.It can be applied almost in the feedback control of Z-axis of all SPM instruments.It is very important to recognize atoms accurately and speedily.
What problem does this paper attempt to address?