Model-Based Control of the Scanning Tunneling Microscope: Enabling New Modes of Imaging, Spectroscopy, and Lithography

Hamed Alemansour,S. O. Reza Moheimani
DOI: https://doi.org/10.1109/mcs.2023.3329923
2024-02-02
IEEE Control Systems
Abstract:The principle of scanning tunneling microscopy is based on the quantum mechanical phenomenon of "tunneling," whereby the wavelike properties of electrons allow them to "tunnel" beyond the surface of a solid into regions of space that are forbidden under the rules of classical physics [1]. This phenomenon is used in the scanning tunneling microscope (STM), where electrons tunnel from the apex of a sharp tip to a conducting surface held at a different potential (see "Summary"). The probability of electrons tunneling decreases exponentially as the distance between the two surfaces increases [2]. Hence, electrons tunnel mostly from the very last atom on the tip apex to the surface. The STM makes use of this extreme sensitivity to distance. A positioner brings the sharp tip of a tungsten probe to a distance of a few angstroms from the sample surface. A bias voltage is applied between the probe tip and the surface, causing electrons to tunnel across the gap.
automation & control systems
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