Deducing information on contamination in spacecraft from images via TOF-SIMS

Guang-pu WANG,Yan-hua HUANG,Xu CHEN,Chuan-liang ZHOU,Liang-zhen CHA
DOI: https://doi.org/10.3969/j.issn.1002-0322.2005.06.010
IF: 4
2005-01-01
Vacuum
Abstract:The fingerprint identification of visible trace contaminants on the aerospace materials,including their elements,isotopes and compounds,can be realized by way of the surface mass spectra obtained from the Time of Flight-Secondary Ion Mass Spectrometry(TOF-SIMS).It is especially suitable for the composition analysis of the contaminant which only a limited sample amount is available.Emphasizes the procedure how to deduce further the information on the contaminants from some typical secondary ion images via TOF-SIMS with gold as primary ion source.Due to the unique parallel mass registration ability of TOF-SIMS,the complete mass spectrum is stored in each and every pixel of the secondary ion surface imaging and the images of any mass can be reconstructed.Comparing with quadrupole and magnetic SIMS,TOF-SIMS is proved more suitable for imaging analysis of the complex spacecraft contaminants.
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