Applications of Time-of-flight Secondary Ion Mass Spectroscopy in the Tribological Studies

CONG Pei-hong,LI Tong-sheng,LIU Xu-jun,MORI Shigeyuki
DOI: https://doi.org/10.3321/j.issn:1004-0595.2007.06.019
2007-01-01
Tribology
Abstract:Secondary ion mass spectroscopy(SIMS) features the unique qualities of mass spectrometry,such as ppm-ppb sensitivity,isotope distinction,and detection of even involatile organic molecular species.It is a powerful surface analysis method in all fields where extreme surface sensitivity and molecular surface information are required.Structure, fundamental principle and analysis characteristics of SIMS were outlined.Application of time-of-flight secondary ion mass spectroscopy(TOF-SIMS) in the tribology fields such as in coatings,tribofilms,adsorption and reaction of lubricating oil additives and head-disk interface,etc.were reviewed.Problem in TOF-SIMS analysis was pointed out,and the manifold applications of TOF-SIMS in tribologcial studies was inspired.
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