Abstract:Time-of-flight secondary ion mass spectrometry (ToF-SIMS) has been extensively used in surface analysis due to its high mass resolution, sensitivity, and mass spectral imaging capabilities. Static ToF-SIMS has mainly been used for solid material analysis; however, its application in environmental organics is limited. During SIMS spectral analysis, relative mass accuracy and measurement repeatability are key factors for obtaining reliable speciation and acquiring chemical insights of the specimens. Herein, we provide an evaluation of four environmentally relevant organic systems, including glyoxal, pyruvic acid, oil-in-water emulsion, and carbon dioxide (CO2) capture solvent (i.e., N-2-ethoxyethyl-3-morpholinopropan-1-amine, EMMPA), to show the spectral measurement repeatability when using static ToF-SIMS. First, sample preparation is essential in acquiring accurate and reproducible results in ToF-SIMS analysis. The mass spectral results show that characteristic peaks observed can be distinguished with reasonable confidence by comparing the observed mass to charge ratios (m/z) to theoretical ones. The statistical analysis of peak areas indicates that the peak area and/or peak height measurement ratios are satisfactory among replicates. Compared with previous studies, the bismuth cluster primary ion beam, namely Bi3 +, has less fragmentation than Bi+. Therefore, Bi3 + is deemed more suitable for organic analysis using static SIMS. Our results show that ToF-SIMS offers a viable approach to study environmental organics including but not limited to aqueous aerosols, wastewater emulsions, and CO2 capture solvents. It is expected that future studies will expand organic speciation with high fidelity due to the continued advancement of SIMS as a sensitive analysis technique.

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Component Distribution of Nano-Carbon Materials Assisted by Time of Flight-Secondary Ion Mass Spectrometer

Applications of Time-of-flight Secondary Ion Mass Spectroscopy in the Tribological Studies

SPUTTERING RESEARCH OF Al-50wt％Sn ALLOY

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High Mass Resolution Multireflection Time-of-Flight Secondary Ion Mass Spectrometer

Elemental Imaging of Mineral Surface by Laser Ionization Time-Of-Flight Mass Spectrometry

A preliminary comparison of time-of-flight laser ionization and secondary ion mass spectrometry in solids analysis

Application of high-spatial-resolution secondary ion mass spectrometry for nanoscale chemical mapping of lithium in an Al-Li alloy

Atom-probe Field Ion Microscope Analysis of Surfaces of Materials

Effects of Atom Probe Analysis Parameters on Composition Measurement of Precipitates in an Al-Mg-Si-Cu Alloy

Atomic Species Recognition on Oxide Surfaces Using Low Temperature Scanning Probe Microscopy

FIB’n’SIMS – Advanced Depth Analysis on Hybrid Organic-Inorganic Nanomaterials

Metal/Matrix Enhanced Time-of-flight Secondary Ion Mass Spectrometry for Single Cell Lipids Analysis

Recent Developments on Secondary Ion Mass Spectrometry

Quantitative aluminum alloys analysis using laser-induced breakdown spectroscopy

Probing Aqueous Surfaces by ToF-SIMS

An evaluation of static ToF-SIMS analysis of environmental organics

Design and Performance of a Desktop Time-of-Flight Mass Spectrometer for Analyzing Metal Ions

ToF-SIMS Investigation of Environmental Effects on Analyte Migration in Matrix Coatings for Mass Spectrometry Imaging Using a Newly Developed Vapor Deposition System