Abstract:Laser-based ionization time-of-flight mass spectrometry techniques, as an emerging mass spectrometry imaging technique, has been widely used in material, geology, environment, pharmacology, and especially life science. However, it is difficult to achieve sub-micrometer-scale imaging resolution due to the limits of diffraction limit of light, focusing distance and numerical aperture of focusing lens. The introduction of the near-field optics technique has overcome this limitation. By combining the near-field optics technique and laser ionization mass spectrometry, nanoscale crater on the solid surface could be achieved. In addition, traditional mass spectrometry imaging techniques usually neglect the topographical information of the irregular sample surface and cause unreal imaging. So it is important for multifunctional in-situ characterization to get the chemical and topographical information simultaneously. In this paper, a near-field nanometer aperture tip desorption postionization time-of-flight mass spectrometer was developed for sub-micrometer-scale chemical and topographical analysis. 532 and 355 nm laser were used as the desorption and postionizationlaser respectively. A tuning fork based AFM system was used to control the distance between the tip and sample. Copper phthalocyanine molecular layers was ablated to produce a series of nanoscale craters with the size from 550 to 850 nm, which indicated that the technique could achieve sub-micrometer-scale lateral resolution. Furthermore, a mass spectrometry imaging with high lateral resolution was carried out on a 7. 5 mu mX 7. 5 mu m copper phthalocyanine grid pattern sample. As the results showed, the chemical imaging of the sample surface was achieved simultaneously with the topographical information, expanding the in-situ characterization ability of the mass spectrometry imaging techniques.

Elemental Imaging of Mineral Surface by Laser Ionization Time-Of-Flight Mass Spectrometry

Elemental Imaging Via Laser Ionization Orthogonal Time-of-Flight Mass Spectrometry

Laser Ionization Orthogonal Time-of-Flight Mass Spectrometry for Simultaneous Determination of Nonmetallic Elements in Solids

Three-Dimensional Elemental Imaging of Nantan Meteorite Via Femtosecond Laser Ionization Time-of-Flight Mass Spectrometry.

Elemental Imaging Method Based on a Dielectric Barrier Discharge Probe Coupled with Inductively Coupled Plasma Mass Spectrometry

Semiquantitative Multielemental Analysis of Biological Samples by a Laser Ionization Orthogonal Time-of-flight Mass Spectrometer.

Three-dimensional Elemental Imaging of Material Surface Using Image-Assisted Laser-Induced Breakdown Spectroscopy

Semi-Quantitative Analysis of Geological Samples Using Laser Plasma Time-Of-Flight Mass Spectrometry

Three-dimensional Topographic and Multi-Elemental Mapping by Unilateral-Shift-subtracting Confocal Controlled LIBS Microscopy

Rapid and high-resolution visualization elements analysis of material surface based on laser-induced breakdown spectroscopy and hyperspectral imaging

High spatial resolution quantitative elemental imaging of foraminifer by laser ablation-inductively coupled plasma-mass spectrometry

Laser Ionization Time-of-flight Mass Spectrometry for Direct Elemental Analysis

Study on Distribution of Elements in Deep-Sea Pacific Polymetallic Nodules Via Two-Dimensional Mapping Laser Ionization Orthogonal Time-Of-Flight Mass Spectrometry

High Irradiance Laser Ionization Mass Spectrometry for Direct Speciation of Iron Oxides

High Irradiance Laser Ionization Orthogonal Time‐of‐flight Mass Spectrometry: A Versatile Tool for Solid Analysis

Novel Combined Instrumentation for Laser-Induced Breakdown Spectroscopy and Raman Spectroscopy for the in Situ Atomic and Molecular Analysis of Minerals

Single-cell Elemental Analysis Via High Irradiance Femtosecond Laser Ionization Time-of-flight Mass Spectrometry.

Surface Morphological and Elemental Imaging by Low Power Atmospheric Pulsed Spark Discharge Optical Emission Spectrometry

Buffer-gas Assisted High Irradiance Femtosecond Laser Ionization Orthogonal Time-of-flight Mass Spectrometry for Rapid Depth Profiling

The Analysis of Ores by Laser Ablation and Ionization Time-of-Flight Mass Spectrometer and Technique Comparison

Laser Desorption Time-of-Flight Mass Spectrometer for Sub-Micrometer-Scale Mass Spectrometry Imaging Using Near-Field Optics Technique