Abstract:Laser-based ionization time-of-flight mass spectrometry techniques, as an emerging mass spectrometry imaging technique, has been widely used in material, geology, environment, pharmacology, and especially life science. However, it is difficult to achieve sub-micrometer-scale imaging resolution due to the limits of diffraction limit of light, focusing distance and numerical aperture of focusing lens. The introduction of the near-field optics technique has overcome this limitation. By combining the near-field optics technique and laser ionization mass spectrometry, nanoscale crater on the solid surface could be achieved. In addition, traditional mass spectrometry imaging techniques usually neglect the topographical information of the irregular sample surface and cause unreal imaging. So it is important for multifunctional in-situ characterization to get the chemical and topographical information simultaneously. In this paper, a near-field nanometer aperture tip desorption postionization time-of-flight mass spectrometer was developed for sub-micrometer-scale chemical and topographical analysis. 532 and 355 nm laser were used as the desorption and postionizationlaser respectively. A tuning fork based AFM system was used to control the distance between the tip and sample. Copper phthalocyanine molecular layers was ablated to produce a series of nanoscale craters with the size from 550 to 850 nm, which indicated that the technique could achieve sub-micrometer-scale lateral resolution. Furthermore, a mass spectrometry imaging with high lateral resolution was carried out on a 7. 5 mu mX 7. 5 mu m copper phthalocyanine grid pattern sample. As the results showed, the chemical imaging of the sample surface was achieved simultaneously with the topographical information, expanding the in-situ characterization ability of the mass spectrometry imaging techniques.

Buffer-gas Assisted High Irradiance Femtosecond Laser Ionization Orthogonal Time-of-flight Mass Spectrometry for Rapid Depth Profiling

Depth Profiling Of Nanometer Thin Layers By Laser Desorption And Laser Postionization Time-Of-Flight Mass Spectrometry

High Irradiance Laser Ionization Orthogonal Time‐of‐flight Mass Spectrometry: A Versatile Tool for Solid Analysis

A small high-irradiance laser ionization time-of-flight mass spectrometer.

Single-cell Elemental Analysis Via High Irradiance Femtosecond Laser Ionization Time-of-flight Mass Spectrometry.

Application of Femtosecond Laser Mass Spectrometry to the Analysis of Volatile Organic Compounds

Femtogram Detection and Quantitation of Residues Using Laser Ionization Orthogonal Time-Of-Flight Mass Spectrometry

Laser Ionization Time-of-flight Mass Spectrometry for Direct Elemental Analysis

Laser Desorption Time-of-Flight Mass Spectrometer for Sub-Micrometer-Scale Mass Spectrometry Imaging Using Near-Field Optics Technique

Semiquantitative Multielemental Analysis of Biological Samples by a Laser Ionization Orthogonal Time-of-flight Mass Spectrometer.

Femtosecond laser ablation (fs-LA) XPS – A novel XPS depth profiling technique for thin films, coatings and multi-layered structures

Depth Profiling of Nanometer Coatings by Low Temperature Plasma Probe Combined with Inductively Coupled Plasma Mass Spectrometry.

Simultaneous acquisition of elemental, fragmental, and molecular information on organometallic compounds.

Sub-micrometer-scale Chemical Analysis by Nanosecond-Laser-induced Tip-Enhanced Ablation and Ionization Time-of-flight Mass Spectrometry

High Irradiance Laser Ionization Mass Spectrometry

Design of a Laser Ionization Source and Its Application on Desktop Time-of-Flight Mass Spectrometer

Laser Ionization Orthogonal Time-of-Flight Mass Spectrometry for Simultaneous Determination of Nonmetallic Elements in Solids

High Sensitivity of Fluorine Gas-Assisted FIB-TOF-SIMS for Chemical Characterization of Buried Sublayers in Thin Films

High Spatial Resolution Mapping of Deposition Layers on Plasma Facing Materials by Laser Ablation Microprobe Time-of-flight Mass Spectroscopy

Laser ablation and ionization time-of-flight mass spectrometer with orthogonal sample introduction and axial field rf-only quadrupole cooling

Feasibility of applying microsecond-pulse glow discharge time of flight mass spectrometry in surface depth analysis