Abstract:Time-of-flight secondary ion mass spectrometry (TOF-SIMS) is a sensitive surface analytical technology, which can simultaneously acquire diverse chemical components and their precise locations on the surfaces of samples without any requirements for chemical damage pretreatments or additional matrices. Commonly, the quality control of TCMs (traditional Chinese medicines) is limited by the qualitative and quantitative evaluations of the specifically extractive constituents. In this study, a practical sample preparation strategy named two-layered media embedding sample preparation was developed to obtain ideal freezing sections of dried materials of Cordyceps sinensis . Meanwhile, the well-established sample preparation method was applied for in situ chemical profiling and imaging of natural (NCS) and cultured Cordyceps sinensis (CCS) by using TOF-SIMS. More than 200 components were tentatively identified and imaged in NCS and CCS at the same time. Mass spectrometry imaging revealed that most components have even distributions in caterpillars of Cordyceps sinensis , while TAGs, DAGs, MAGs, and FAs only have distributions outside caterpillars’ digestive chambers. This is the first time that components were in situ imaged for Cordyceps sinensis to exhibit the chemical distributions which have never been achieved by other analytical techniques so far. In addition, chemometrics was used to simplify and explain the massive TOF-SIMS mass data sets, which revealed the high chemical similarity between CCS and NCS. Furthermore, the relative quantification of TOF-SIMS data showed that CCS has comparable proportions of amino acids, nucleosides, monosaccharides, sphingolipids, sterols and other principles to NCS except for fatty acids, glycerides and glycerophospholipids. The higher amounts of TAGs and DAGs in CCS were confirmed by quantitative 1 H-NMR, indicating reliable relative quantification of TOF-SIMS. In general, our research developed a novel approach of TOF-SIMS for in situ chemical analysis of TCMs, and its successful application in comparative study of CCS and NCS suggested that TOF-SIMS is an advanced and promising analytical technology for the research of TCMs.

Spacecraft Contamination Characterization with Time-of-Flight Secondary Ion Mass Spectrometry

RESEARCH ON THE NEW TECHNIQUE FOR SPACECRAFT CONTAMINATION ANALYSIS

Deducing information on contamination in spacecraft from images via TOF-SIMS

High Mass Resolution Multireflection Time-of-Flight Secondary Ion Mass Spectrometer

Surface Analysis of Photolithographic Patterns Using Tof-Sims and Pca

Applications of Time-of-flight Secondary Ion Mass Spectroscopy in the Tribological Studies

Molecular detection of per- and polyfluoroalkyl substances in water using time-of-flight secondary ion mass spectrometry

An evaluation of static ToF-SIMS analysis of environmental organics

Principal Component Analysis (PCA) of Surface Contamination by TOF-SIMS

Recent Developments on Secondary Ion Mass Spectrometry

ToF‐SIMS Characterization of Microplastics in Soils

An Investigation on Space-Charge Effect in the Time-Of-Flight Mass Spectrometry

Review of Recent Advances in Gas-Assisted Focused Ion Beam Time-of-Flight Secondary Ion Mass Spectrometry (FIB-TOF-SIMS)

Secondary ion mass spectrometry: The application in the analysis of atmospheric particulate matter

DEVELOPMENT OF A SIRI TOFMS AND THE APPLICATION RESEARCH PROGRESS

On-line Characterization of Individual Particles from Automobile Emission by ATOFMS

High Irradiance Laser Ionization Orthogonal Time‐of‐flight Mass Spectrometry: A Versatile Tool for Solid Analysis

A small high-irradiance laser ionization time-of-flight mass spectrometer.

In situ Chemical Profiling and Imaging of Cultured and Natural Cordyceps sinensis by TOF-SIMS

Metal/Matrix Enhanced Time-of-flight Secondary Ion Mass Spectrometry for Single Cell Lipids Analysis

Design and Performance of a Desktop Time-of-Flight Mass Spectrometer for Analyzing Metal Ions