Abstract:Time-of-flight secondary ion mass spectrometry (ToF-SIMS) has been extensively used in surface analysis due to its high mass resolution, sensitivity, and mass spectral imaging capabilities. Static ToF-SIMS has mainly been used for solid material analysis; however, its application in environmental organics is limited. During SIMS spectral analysis, relative mass accuracy and measurement repeatability are key factors for obtaining reliable speciation and acquiring chemical insights of the specimens. Herein, we provide an evaluation of four environmentally relevant organic systems, including glyoxal, pyruvic acid, oil-in-water emulsion, and carbon dioxide (CO2) capture solvent (i.e., N-2-ethoxyethyl-3-morpholinopropan-1-amine, EMMPA), to show the spectral measurement repeatability when using static ToF-SIMS. First, sample preparation is essential in acquiring accurate and reproducible results in ToF-SIMS analysis. The mass spectral results show that characteristic peaks observed can be distinguished with reasonable confidence by comparing the observed mass to charge ratios (m/z) to theoretical ones. The statistical analysis of peak areas indicates that the peak area and/or peak height measurement ratios are satisfactory among replicates. Compared with previous studies, the bismuth cluster primary ion beam, namely Bi3 +, has less fragmentation than Bi+. Therefore, Bi3 + is deemed more suitable for organic analysis using static SIMS. Our results show that ToF-SIMS offers a viable approach to study environmental organics including but not limited to aqueous aerosols, wastewater emulsions, and CO2 capture solvents. It is expected that future studies will expand organic speciation with high fidelity due to the continued advancement of SIMS as a sensitive analysis technique.

Principal Component Analysis (PCA) of Surface Contamination by TOF-SIMS

Surface Analysis of Photolithographic Patterns Using Tof-Sims and Pca

Principal component analysis image fusion of TOF-SIMS and microscopic images and low intensity secondary ion enhancement by pixel reduction

Novel principal component analysis tool based on python for analysis of complex spectra of time-of-flight secondary ion mass spectrometry

Deducing information on contamination in spacecraft from images via TOF-SIMS

Identification of a lipid‐related peak set to enhance the interpretation of TOF‐SIMS data from model and cellular membranes

Dual-Principal Component Analysis of the Raman Spectrum Matrix to Automatically Identify and Visualize Microplastics and Nanoplastics

Time-of-Flight Secondary Ion Mass Spectrometry of a Range of Coal Samples: A Chemometrics (PCA, Cluster, and PLS) Analysis

An evaluation of static ToF-SIMS analysis of environmental organics

Component Distribution of Nano-Carbon Materials Assisted by Time of Flight-Secondary Ion Mass Spectrometer

Processing Next-Generation Mass Spectrometry Imaging Data: Principal Component Analysis at Scale

RESEARCH ON THE NEW TECHNIQUE FOR SPACECRAFT CONTAMINATION ANALYSIS

Identifying Process Differences with ToF-SIMS: An MVA Decomposition Strategy

Probing Surface Information of Alloy by Time of Flight-Secondary Ion Mass Spectrometer

Principal Component Analysis in Projection and Image Domains—Another Form of Spectral Imaging in Photon-Counting CT

Single Particle Inductively Coupled Plasma Time-of-Flight Mass Spectrometry—A Powerful Tool for the Analysis of Nanoparticles in the Environment

High Mass Resolution Multireflection Time-of-Flight Secondary Ion Mass Spectrometer

Dynamic Principal Component Analysis: Identifying the Relationship between Multiple Air Pollutants

Acquisition and analysis of hyperspectral data for surface contamination level of insulating materials

Molecular detection of per- and polyfluoroalkyl substances in water using time-of-flight secondary ion mass spectrometry

Performance evaluation of principal component analysis for dynamic fluorescence tomographic imaging in measurement space