Synthesis and property study on negative thermal expansion ZrW2 O8 thin film

Xiuj SUN,Fangyuan ZUO,Lei JIAO,Xiaonong CHENG,Juan YANG,Qinqin LIU,Taiyun CHEN
DOI: https://doi.org/10.3969/j.issn.1001-9731.2016.12.017
2016-01-01
Abstract:ZrW2 O8 thin film was synthesized using sol-gel method.The structure and morphology of the resul-ting film were characterized by Powder X-ray diffraction (XRD),Scanning electron microscopy (SEM)and X-ray photoelectron spectroscopy (XPS)respectively.The results show that the films are single phase ofα-ZrW2 O8 .The surface of ZrW2 O8 thin film has small holes without obvious cracks.On the whole,the film is com-posed of rod-like particles,during which film is composed of small particles.The thickness of the film is about 500 nm.ZrW2 O8 thin film is transparent in the visible region with two absorb peaks in the ultraviolet region, which are 348.3 and 277.2 nm respectively.
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