Effects of Ru Seed Layer on Structural Properties of CoCrPt-SiO2 Perpendicular Media

Junmin ZHANG,Chuanju WANG,Yue SHEN,Zhilong TAN,Jun BI,Ming WEN,Yantian ZHOU
DOI: https://doi.org/10.3969/j.issn.1004-0676.2015.02.005
2015-01-01
Abstract:CoCrPt-SiO2 perpendicular recording films were prepared by the magnetron sputtering with a series of Ru films as the seed layer. The microstructure of Ru seed layers and their effects on the grain size, roughness and surface morphology of CoCrPt-SiO2 granular films were also investigated. It was found that the microstructure of seed layer obviously affected the structure and grain isolation of recording layers. The grain size and roughness of CoCrPt-SiO2 recording layer increased with the increase of the thickness of Ru seed layer. The thin and rough Ru seed layer could be used for the high-density magnetic recording media, but the Ru seed layer with a proper thickness of 70 nm facilitated a perfect isolation, and consequently excellent magnetic properties could be acquired for the final products.
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