Measurement of Damage Threshold of Semiconductor Saturable-Absorber Mirrors

Jian-ping LI,Shi-ying CAO,Zu-bi WU,Yong-gang WANG,Zhi-gang ZHANG,Qing-yue WANG,You-bo ZHAO,Xiao-nong ZHU
DOI: https://doi.org/10.3969/j.issn.1672-6030.2005.02.011
2005-01-01
Abstract:Semiconductor saturable-absorber mirrors(SESAM)are practical device for mode-locking of femtosecond pulses laser.However, the damage threshold of the SESAM is very close to that for continues wave(CW)mode-locking.Therefore, it is very important to measure and to improve the damage threshold.Using femtose-(cond) pulses laser, the damage threshold of them with 50 pulses is measured with a pulse duration of 50 fs, 200 fs and 400 fs respectively.The results show that the damage threshold of Si and SESAM as grown is higher than that of the etched SESAM, and increases with the pulse duration, whereas those for etched SESAM decrease with pulse duration.
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