Optical characteristics of semiconductor saturable absorber mirrors investigated by the reflection Z-scan technique

Kai Wang,Qi-rong Xing,Huan-yu Li,Jian-ping Li,Zhi-gang Zhang,Ning Zhang,Lu Chai,Qing-yue Wang
DOI: https://doi.org/10.1016/j.optcom.2006.03.022
IF: 2.4
2006-01-01
Optics Communications
Abstract:Recently, the semiconductor saturable absorber mirror (SESAM) has become a key component of passive mode-locked solid-state lasers. Here we present a simple method based on the reflection Z-scan technique to measure the key optical parameters of SESAM such as saturation fluence and modulation depth. The experimental results demonstrate that our method is able to perform with a high accuracy of 10−4 and a dynamic range of over four orders of magnitude.
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