Effect of qualities of MPCVD diamond film on microwave dielectric properties in K-Ka band

Yanqing LIU,Minghui DING,Jingjie SU,Yifeng LI,Weizhong TANG
DOI: https://doi.org/10.14106/j.cnki.1001-2028.2017.04.006
2017-01-01
Abstract:A K band split-cylinder resonator device was developed to measure dielectric properties of diamond films prepared by microwave plasma chemical vapor deposition (MPCVD),and the results were compared with the measured by using Ka band split-cylinder resonator device.The quality of diamond films was analyzed by Raman spectroscopy.It shows that,dielectric loss ranges from 3.8 × 10-5 to 76.8× 10-5,depending on the quality measured by Raman spectroscopy.Moreover,due to electrical conductivity of diamond film,the dielectric loss of high quality diamond film at K band is obviously higher than that at Ka band,and due to one-phonon excitation of acoustic vibrations or Rayleigh scatterings,the dielectric loss of poor quality diamond film presents a contrary tendency.
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