Abstract:Positive-ion mass spectrometry (PIMS) is a positive-to-negative ion conversion metrology that just operated on the opposite of traditional accelerator mass spectrometry (AMS) on high-precision radiocarbon dating. With a higher efficient simple structure plasma ion sources instead of AMS sputter ion sources, lower ion energy (tens keV) in place of MeV, and limited footprint facility, PIMS will be a powerful competitor to AMS in the future. To precisely measure 14C, interference of molecular isobars (such as 12CH2, 13CH) will be eliminated with higher charged ions (charge state ≥ 3; molecular cations 12CH2 2+ is metastable, can be eliminated by higher stripping pressure.), nitrogen will be eliminated inside the charge-exchange cell (CXC) through charge exchanging with target gas. To demonstrate the probability of PIMS with a 2.45 GHz ECR ion source, an experiment was launched at Peking University (PKU). A compact permanent magnet 2.45 GHz ECR ion source is designed to produce carbon ions from CO2. A CXC unit was installed after the extraction system and ethylene is chosen as charge exchange gas. Preliminary experiments prove that more than hundreds of microamp of C2+ beam can be produced with this ECR source. By injecting ethylene into CXC, several microamp C- beam was detected and the C2+ ions charge exchange efficiency to C- ions can reach close to 5%.

Production Yield of C-H Cluster From Carbon Material Bombarded by MeV Ions

Comparison of Secondary Ion Emissions from Carbon Nanotubes under Bombardments of Mev Si and Si-2 Clusters

Identification And Rutherford Backscattering Measurement Of Mev Carbon Cluster Ions

The Electron Exchange of Mev Hydrogen Micro-Cluster Ions with Solids

MeV Microcluster Beam Interaction with Matter

Production and photoionization of clusters for CH3CN/C2H3Cl complex system

Damage production in silicon by MeV Si cluster irradiation

Investigation On Collision Of Si2+ With H From Intermediate To High Projectile Energies

Non-linear Effect of Secondary Ion Emission Induced by Energetic Clusters

Acceleration of C2 +-C8 + clusters to MeV energies

Study of ion sputtering on AlxSn100-x alloy system

Study on the desorption yield for natural botanic sample induced by energetic heavy ions

Cluster primary ion bombardment of organic materials

Studies of Ion Energy and Yield from Argon Clusters Heated by Intense Femtosecond Laser Pulses

Material-dependent emission mechanism of secondary atomic ions from solids under MeV-energy heavy ion bombardment

Production of C 60 /C 70 Ion Beams

High current H2(+) and H3(+) beam generation by pulsed 2.45 GHz electron cyclotron resonance ion source.

Production Of C60/C70 Ion-Beams

Preliminary Results of Positive Ion Mass Spectrometry Based on a 2.45 GHz ECR Ion Source and a Non-Metallic Gas Target

Molecular Dynamic Simulation of Secondary Ion Emis- Sion from an Al Sample Bombarded with MeV Heavy Ions

Study on sputtering of gas cluster ion beams