Preparation and Properties of CdTe Thin-film Deposited on Glass

ZENG Guang-gen,FENG Liang-Huan,LI Bing,ZHANG Jing-quan,CAI Ya-Ping,ZHENG Jia-Gui,CAI Wei,ZHENG Hua-jing,CHEN Qian,LI Wei
DOI: https://doi.org/10.3969/j.issn.1001-5868.2005.03.018
2005-01-01
Abstract:The XRD,SEM analysis methods were used to research the properties of the CdTe thin-films deposited on glass substrate abraded at different times,by the close-spaced sublimation technique.The results show that the microstructure of CdTe thin-film is dependent on the roughness of substrate surface,and the selected (111) orientation of CdTe should decrease with the increasing roughness of the substrate surface.
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