Nonlinear Capacitance Modeling of Radio Frequency MOSFETs Based on the Statz Model

Jia'nan Xue,Yizhe Liu,Jianjun Gao
DOI: https://doi.org/10.13290/j.cnki.bdtjs.2019.05.007
2019-01-01
Abstract:The applicability of the Statz model to characterize the characteristics of radio frequency (RF) metal-oxide-semiconductor field-effect-transistors (MOSFETs) was studied, and an improved model of MOSFET nonlinear capacitance was proposed. S parameters were measured on a 90 nm gate length MOSFET fabricated by Infineon Technologies with a specification of 4×0.6 μm×18 (number of gate fingers×gate width×number of unit cells). After de-embedding and stripping off all parasitic components, a small signal equivalent circuit model was applied to extract the nonlinear gate-to-source capacitance Cgs and gate-to-drain capacitence Cgd data under multiple bias conditions. The relative errors of the simulation results and experimental data between the traditional Statz model and the improved model were compared. The simulation results and error analysis show that the data of the improved model are well agree with the experimental data, and the error is controlled below 5% in most working range, which proves that the improved model is suitable to characterize the nonlinear capacitance characteristics of MOSFETs.
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