Testing method of silicon micro resonant pressure sensor based on multi-frequency scanning

Bo CHENG,Wei-zheng YUAN,Sen REN,Fei WANG
DOI: https://doi.org/10.13873/J.1000-9787(2017)10-0017-03
2017-01-01
Abstract:For testing silicon micro resonant pressure sensor with high efficiency and precision,a testing method of frequency characteristics based on multi-frequency scanning is presented. Multi-frequency scanning signals are superimposed by digital circuit and act as driving signal to realize frequency characteristic measurement,with high precision and high efficiency. The multi-frequency scanning testing system with FPGA as the core part is built,and 4 sine frequency scanning signal is superimposed. The experimental result shows that the precision of multi-frequency scanning test is basically the same as steady-state scanning test,but it improves the efficiency by 4 times. The multi-frequency scanning test method can greatly improve the testing efficiency on the premise of test precision,and can meet the testing requirements of high Q value sensor as well as its mass production better.
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