Quantification of Local Dislocation Density Using 3D Synchrotron Monochromatic X-ray Microdiffraction

Guangni Zhou,Wolfgang Pantleon,Ruqing Xu,Wenjun Liu,Kai Chen,Yubin Zhang
DOI: https://doi.org/10.1080/21663831.2020.1862932
2021-01-01
Materials Research Letters
Abstract:A novel approach evolved from the classical Wilkens’ method has been developed to quantify the local dislocation density based on X-ray radial profiles obtained by 3D synchrotron monochromatic X-ray microdiffraction. A deformed Ni-based superalloy consisting of γ matrix and γ′ precipitates has been employed as model material. The quantitative results show that the local dislocation densities vary with the depths along the incident X-ray beam in both phases and are consistently higher in the γ matrix than in the γ′ precipitates. The results from X-ray microdiffraction are in general agreement with the transmission electron microscopic observations.
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