Abstract:Time-domain thermoreflectance (TDTR) is a widely used technique for characterizing the thermal properties of bulk and thin-film materials. Traditional TDTR analyses typically focus on positive delay time data for fitting, often requiring multiple-frequency measurements to simultaneously determine thermal conductivity and heat capacity. However, this multiple-frequency approach is cumbersome and may introduce inaccuracies due to inconsistencies across different frequency measurements. In this study, we propose a novel solution to these challenges by harnessing the often-overlooked negative delay time data in TDTR. By integrating these data points, we offer a streamlined, single-frequency method that simultaneously measures thermal conductivity, heat capacity, and interface thermal conductance for both bulk and thin-film materials, enhancing measurement efficiency and accuracy. We demonstrate the effectiveness of this method by measuring several bulk samples including sapphire, silicon, diamond, and Si0.992Ge0.008, and several thin-film samples including a 1.76-{\mu}m-thick gallium nitride (GaN) film epitaxially grown on a silicon substrate, a 320-nm-thick gallium oxide ({\epsilon}-Ga2O3) film epitaxially grown on a silicon carbide substrate, and a 330-nm-thick tantalum nitride (TaN) film deposited on a sapphire substrate, all coated with an aluminum (Al) transducer layer on the surface. Our results show that the new method accurately determines the thermal conductivity and heat capacity of these samples as well as the Al/sample interface thermal conductance using a single modulation frequency, except for the Si0.992Ge0.008 sample. This study sheds light on the untapped potential of TDTR, offering a new, efficient, and accurate avenue for thermal analysis in material science.

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Thermal Visualization of Buried Interfaces Enabled by Ratio Signal and Steady-State Heating of Time-Domain Thermoreflectance

Thermal Visualization of Buried Interfaces by Transient and Steady-State Responses of Time-Domain Thermoreflectance

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High Temperature Monitoring of Silicon Carbide Ceramics by Confocal Energy Dispersive X-Ray Fluorescence Spectrometry

Thermal Diffusivity and Oxidation of 2D and 3D C/SiC Composites from 600°C to 1400°C

Infrared thermal wave imaging for nondestructive detection and measurement of the C/SiC composites

Testing and evaluation of oxidation damages in 2D C/SiC by thermography

In Situ And Noncontact Measurement Of Silicon Membrane Thermal Conductivity

The inspection of coating thickness uniformity of SiC-coated carbon-carbon (C/C) composites by laser-induced thermal-wave imaging

High-temperature tensile strength of C/SiC composite under laser-induced high heating flux in an aerobic environment

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