Abstract:High heat fluxes generated in electronics and semiconductor packages require materials with high thermal conductivity to effectively diffuse the heat and avoid local hotspots. Engineered heat spreading materials typically exhibit anisotropic conduction behavior due to their composite construction. The design of thermal management solutions is often limited by the lack of fast and accurate characterization techniques for such anisotropic materials. A popular technique for measuring the thermal diffusivity of bulk materials is the Ångstrom method, where a thin strip or rod of material is heated periodically at one end, and the corresponding transient temperature profile is used to infer the thermal diffusivity. However, this method is generally limited to the characterization of one-dimensional samples and requires multiple measurements with multiple samples to characterize anisotropic materials. Here, we present a new measurement technique for characterizing the isotropic and anisotropic in-plane thermal properties of thin films and sheets as an extension of the one-dimensional Ångstrom method and other lock-in thermography techniques. The measurement leverages non-contact infrared temperature mapping to measure the thermal response from laser-based periodic heating at the center of a suspended thin film sample. Uniquely, our novel data extraction method does not require precise knowledge of the boundary conditions. To validate the accuracy of this technique, numerical models are developed to generate transient temperature profiles for hypothetical anisotropic materials with known properties. The resultant temperature profiles are processed through our fitting algorithm to extract the in-plane thermal conductivities without knowledge of the input properties of the model. Across a wide range of in-plane thermal conductivities, these results agree well with the input values. Experiments demonstrate the approach for a known isotropic reference material and an anisotropic heat spreading material. The limits of accuracy of this technique are identified based on the experimental and sample parameters. Further standardization of this measurement technique will enable the development and characterization of engineered heat spreading materials with desired anisotropic properties for various applications.

Pump-probe measurements of the thermal conductivity tensor for materials lacking in-plane symmetry.

Probing Anisotropic Heat Transport Using Time-Domain Thermoreflectance with Offset Laser Spots

A New Elliptical-Beam Method Based on Time-Domain Thermoreflectance (TDTR) to Measure the In-Plane Anisotropic Thermal Conductivity and Its Comparison with the Beam-Offset Method

A New Spatial-Domain Thermoreflectance Method to Measure a Broad Range of Anisotropic In-Plane Thermal Conductivity

A new spatial-scan thermoreflectance method to measure a broad range of anisotropic in-plane thermal conductivity

Frequency-domain probe beam deflection method for measurement of thermal conductivity of materials on micron length scale

Time-domain thermoreflectance (TDTR) measurements of anisotropic thermal conductivity using a variable spot size approach

In-plane thermal diffusivity determination using beam-offset frequency-domain thermoreflectance with a one-dimensional optical heat source

Thermal Conductivity Imaging at Micrometre-Scale Resolution for Combinatorial Studies of Materials

Thermal Conductivity Mapping of Oxidized SiC/SiC Composites by Time‐domain Thermoreflectance with Heterodyne Detection

Simultaneous Measurement of Thermal Conductivity, Heat Capacity, and Interfacial Thermal Conductance by Leveraging Negative Delay-Time Data in Time-Domain Thermoreflectance

Using transducerless time-domain thermoreflectance technique to measure in- and cross-plane thermal conductivity of nanofilms

Invited Article: Micron Resolution Spatially Resolved Measurement of Heat Capacity Using Dual-Frequency Time-Domain Thermoreflectance.

A laser-based Ångstrom method for in-plane thermal characterization of isotropic and anisotropic materials using infrared imaging

Two-Channel Model for Nonequilibrium Thermal Transport in Pump-Probe Experiments

Ultrafast Thermoreflectance Techniques for Measuring Thermal Conductivity and Interface Thermal Conductance of Thin Films

Thermometry and Thermal Transport in Micro/Nanoscale Solid-State Devices and Structures

Simultaneous measurement of in-plane and through-plane thermal conductivity using beam-offset frequency domain thermoreflectance.

Micron-Scale Measurements of the Coefficient of Thermal Expansion by Time-Domain Probe Beam Deflection

Simultaneous measurement of anisotropic thermal conductivity and thermal boundary conductance of 2-dimensional materials