Testing of SCA Waveform Digitization ASIC for High-Precision Time Measurement

Han Chen,Jiajun Qin,Lei Zhao,Yuting Wang,Yi Cao,Jiaming Li,Shubin Liu,Qi An
DOI: https://doi.org/10.1109/ebccsp51266.2020.9291356
2020-01-01
Abstract:High speed waveform digitization is one of the methods that can be applied to time measurement. In our previous work, a 5-Gsps switched capacitor array (SCA) chip for high-precision time measurement was designed. In this paper, this SCA ASIC is tested, and the effects of mismatches between sampling cells inside the ASIC are analyzed. The test results show that after the calibration and mismatch correction processes, a time resolution of better than 10ps can be successfully achieved.
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