Gate Stack Engineering in 2D Semiconductor FETs for Electronic Applications

Hao Zhu,Jing Xu,Longfei He,Xinran Nie,Lin Chen,Qingqing Sun,David Wei Zhang
DOI: https://doi.org/10.1149/08609.0051ecst
2018-01-01
Abstract:In this work, we present an experimental study on the gate stack engineering in transition metal dichalcogenide-based field-effect transistor. The electrical performance has been significantly improved due to enhanced gate control through the effective structure engineering. The interesting photoresponsivity and low-frequency noise characteristics have been observed which make it very attractive for photodetector and various sensing applications.
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