Abstract:For modern SoC systems, stringent requirements on on-chip clock generators include low area, low power consumption, environmental insensitivity, and the lowest possible jitter performance. Multiplying Delay-Locked Loop (MDLL) [1-2], subharmonically injection-locked techniques [3], and sub-sampling techniques [4-5] can significantly improve the random jitter characteristics of a clock generator. However, in order to guarantee their correct operation and optimal performance over process-voltage-temperature (PVT) variations, each method requires additional calibration circuits, which impose difficult-to-meet timing constraints. In the case of an injection-locked PLL (IL-PLL), a free-running frequency calibration is required. However, the output of an injection-locked oscillator is always fixed at the desired frequency, so a shift in the free-running frequency (e.g. caused by temperature and voltage variations) cannot be simply compensated for by using a frequency-locked loop (FLL). Therefore, we propose the use of a dual-loop topology with one free-running voltage-controlled oscillator (VCO) as a replica VCO placed inside a FLL for tracking temperature and voltage drift. The other VCO (the main VCO) is injection locked for producing a low-jitter clock, while the free-running frequency shift can be compensated for by the replica loop. The method provides robust output over temperature and voltage variations.

A Jitter Programmable Digital Bang-Bang PLL Using PVT-Invariant Stochastic Jitter Monitor

A Compact, Low-Power and Low-Jitter Dual-Loop Injection Locked PLL Using All-Digital PVT Calibration

A 0.4-Ps-jitter −52-Dbc-spur Synthesizable Injection-Locked PLL with Self-Clocked Nonoverlap Update and Slope-Balanced Subsampling BBPD

An 11.1-to-14.9ghz Digital-Integral Hybrid-Proportional Fractional-N PLL with an LC DTC Achieving 0.52μs Locking Time and 41.3f5 Jitter

A 0.022mm2 970µw Dual-Loop Injection-Locked PLL with −243db FOM Using Synthesizable All-Digital PVT Calibration Circuits

A Dual-Loop Injection-Locked PLL with All-Digital Background Calibration System for On-Chip Clock Generation

A 2.5mw Fully-Passive 2Nd-Order Noise-Shaping Bang-Bang PLL with Adaptive DCO Gain Controller Achieving 305-Fsrms Jitter and –246.3 Db FoM

A 4.7ghz Synchronized-Multi-Reference PLL with In-Band Phase Noise Lower Than Reference Phase $\text{noise +20}\Text{logn}_{\mathrm{d}\mathrm{i}\mathrm{v}}$

A 2.6ghz ΔΣ Fractional-N Bang-Bang PLL with FIR-Embedded Injection-Locking Phase-Domain Low-Pass Filter

A 1.2ps-jitter fully-synthesizable fully-calibrated fractional-N injection-locked PLL using true arbitrary nonlinearity calibration technique

A 2.4-Ghz Sub-Sampling PLL with an Adaptive and No Power Contribution FLL Achieving 103.58 Fs Rms Jitter and −257.8 Db FOM

A 28.8-to-43.2 GHz 79.8 fs$_{\mathrm{rms}}$ Jitter and $-$78.5 dBc Reference Spur PLL Exploiting Complementary Mixing Phase Detector With Mismatch Calibration

A 4224 MHz Low Jitter Phase-Locked Loop in 0.13-Μm CMOS Technology

A 0.2-to-39.2ghz 66.2-Fs Jitter and −71.3dbc Spur Sub-Sampling PLL Using DAC-Based Constant Control Voltage Compensator and Quad-Mode 2nd Harmonic Filtering Oscillator

A 21.8-41.6Ghz Fast-Locking Sub-Sampling PLL with Dead Zone Automatic Controller Achieving 62.7-Fs Jitter and −250.3db FoM

Analysis and Design of Low-Jitter Digital Bang-Bang Phase-Locked Loops

A 56-GHz Fractional-N PLL With 110-fs Jitter

A-236.5dB Jitter-FoM Dual-Path RO-PLL with Improved Supply Sensitivity

A Compact, Low-Power, and Low-Jitter Fractional-N Phase-Locked Loop with a Single-Ended Ring Voltage-Controlled Oscillator in a 12 Nm CMOS FinFET

A Low Jitter PLL in a 90nm CMOS Digital Process

Design and Analysis of DTC-Free ΔΣ Bang-Bang Phase-Locked Loops.