Light Emissions from Linbo3/Sio2/Si Structures

XL Wu,Y Gu,N Tang,SS Deng,XM Bao
DOI: https://doi.org/10.1088/0953-8984/15/2/104
2003-01-01
Abstract:LiNbO3 (LN) films with a high degree of (006) texture were deposited on Si-based dense SiO2 layers by pulsed laser deposition. After annealing, the LN/SiO2/Si structures were revealed to have ultraviolet-, green-, and redemitting properties related to self-trapped excitons and E' defect pairs in the SiO2 surface, which are induced by the photorefractive effect of the LN films. The emission wavelength can be tuned by introducing different dopants into the LN films. Waveguiding properties of the structures were demonstrated. The results obtained indicate that the LN/SiO2/Si structures could be expected to have important applications in modern optoelectronic integration.
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