Step Morphology of Liquid Phase Epitaxial Gaas Determined by Atomic Force Microscopy

YC Lu,Y Chen,SM Cai,ZF Liu
1995-01-01
Abstract:Single, double and triple growth spirals were observed on liquid phase epitaxy (LPE) grown layers using atomic force microscopy (AFM). Spiral growth arises from the motion of growth steps in a spiral fashion. The LPE grown GaAs Layers show quite a different step morphology as compared with cleaved GaAs crystals. The step treads are atomically flat planes in the cleaved crystals, but are generally not atomically flat planes and rather bow upwards in the LPE layers. The mechanism arousing this difference is unclear.
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