Modified Generalized Stacking Fault Energy Surface of II-VI Ionic Crystals from Excess Electrons and Holes

Yidi Shen,Hongwei Wang,Qi An
DOI: https://doi.org/10.1021/acsaelm.9b00734
IF: 4.494
2020-01-01
ACS Applied Electronic Materials
Abstract:Electron and hole carriers are ubiquitous in semiconductors and play an important role in determining the electronic properties that are essential in biolabeling and electronic device applications. However, it remains unclear how these carriers affect the mechanical properties of semiconductors, although the photomechanical effect has attracted more attention recently. Here, we applied density functional theory (DFT) to examine how electron (or hole) carriers independently influence the generalized stacking faults (GSF) energy surface (gamma-surface) and the deformation mechanism of II-VI ionic semiconductors ZnS, ZnTe, and CdTe. We found that for ZnS, the change in gamma-surface leads to an increased tendency of twinning formation rather than deformation slip compared to the neutral state, whereas this gamma-surface change in both ZnTe and CdTe leads to an increased tendency of deformation slip. Our results suggest that controlling carriers is an effective way to tune the mechanical properties of semiconductors in manufacturing and working conditions.
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