Recovery in heavily deformed nickel during room temperature storage

Yubin Zhang,Oleg Mishin,Naoya Kamikawa,A Godfrey
2014-01-01
Abstract:The microstructural evolution in pure nickel cold deformed to a von Miss strain of 4.8 using an accumulative roll bonding process has been monitored by investigating selected regions after different periods of room-temperature storage. It is found that the quality of electron backscatter diffraction (EBSD) patterns improves during the storage, with no appreciable migration of grain boundaries and triple junctions, as revealed by EBSD and transmission electron microscopy. Tensile test data demonstrate that the strength decreases during the storage. It is suggested that these changes reflect an overall reduction of the dislocation density. The relationship between the microstructure of the as-deformed and recovered sample and their mechanical properties is discussed.
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