Scanning parameter measurement and projected image correction for microfocus X-ray imaging system

Jian-ping NI,Zheng LI,Hong-Tao BAI,Ya-qiang LIU,Jian-ping CHENG,Wen-huan GAO,Ke-jun KANG
DOI: https://doi.org/10.3969/j.issn.0258-0934.2001.03.002
2001-01-01
Abstract:Because of the reinstalling of microfocus X-ray imaging system there will be certain deviation the inherent characteristics of the image intensifier and the image-acquisition device, the acquired projected image is geometrical distorted, this debases the accuracy of the reconstructed image in three-dimensional CT. The current paper dicusses the basic principle of how to solve the precise measurement and calculation of FOD, FDD, and the correction of the geometrical distortion of the projected image.
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