Thickness evaluation of kissing defects in dielectric laminated composites : a high-resolution microwave method

Peiyu Wang,Zhencheng Li,Yongmao Pei,Licheng Zhou
2017-01-01
Abstract:Kissing defects remain a challenge in composite laminates. A high-resolution equiphase frequency truncation (EFT) method was proposed to characterize and evaluate the thickness of kissing defects in dielectric multilayers. Theoretical calculation and simulation consistently show that truncation frequency varies linearly with the thickness. Thickness in range of micrometer and nanometer correspond to frequency difference of several MHz and kHz, respectively. In summary, this method provides a new perspective for experimental study of kissing defects in multilayer dielectric medium with a high sensitivity and high resolution.
What problem does this paper attempt to address?