Abstract:Soldering stacks of high temperature superconducting (HTS) tapes results in a current carrying matrix with high electrical, thermal, and mechanical stability. In some applications, these tape stacks may be exposed to elevated temperatures during thermal heat cycles. Previous research on thermal degradation of high temperature superconductors has been performed with isolated crystals or individual HTS tapes, showing that oxygen-out diffusion from the rare-earth barium copper oxide (REBCO) results in a reduction of the superconducting performance. In this work, the performance of Pb37Sn63 soldered HTS tape stacks with thermal cycling to 170C is quantified through determination of the critical current Ic, the n-value, the linear resistance R in the pre-transition region of the tape stack current-voltage (I-V) traces, and the diffusion coefficient D associated with oxygen-out diffusion. The effect of tape manufacturer and nickel electroplating were considered; three soldered stacks each of unplated Faraday, nickel electroplated Faraday, unplated SuperPower, and nickel electroplated SuperPower tapes were fabricated. Across 20 - 30 one hour thermal cycles, there is no strong correlation observed between the unplated or nickel electroplated tapes. There is however a marked difference in degradation profiles observed between the SuperPower and Faraday tape stacks. For the unplated and plated SuperPower tape stacks, the degradation in Ic generally follows the model to describe oxygen-out diffusion from the superconducting REBCO layer. Significantly less degradation is observed in the unplated and plated Faraday tape stacks, and in some sections Ic even increases slightly across cycles. Further, cases of increasing Ic accompanied with decreasing n are observed, a decoupling between the two parameters. Across all samples, the linear resistance was highest in current-redistribution regions near the leads. Consistent with the model of oxygen-out diffusion and the formation of an increasingly wide oxygen deficient layer in the REBCO, the linear resistance increased with cycle number.

Critical Current Degradation Behavior of Coated Conductor Subjected to Repeat Overcurrent

Research on Fault Current Endurance Capability of Concentric HTS Cable

Thermal degradation analysis and optimization of controlled heat treatment for stacked high temperature superconducting tapes

Continuous Critical Current Measurement of High-Temperature Superconductor Tapes with Magnetic Substrates Using Magnetic-Circuit Method.

Research on overcurrent stability of HTS cable for energy pipeline

Study on the Influence of Skin Effect on AC Loss of YBCO Tape

Investigations on Quench Recovery Characteristics of High-Temperature Superconducting Coated Conductors for Superconducting Fault Current Limiters

Observation And Analysis Of Defects In Impregnated Ybco Racetrack Coil

An Experimental Investigation of Critical Current and Current Distribution Behavior of Parallel Placed HTS Tapes

The stability of the high temperature superconducting DC coils with defects

A Method for Continuous Measurement of Critical Current of HTS Tapes Using Magnetic Circuits

Gamma radiation effects on high-temperature superconducting ReBCO tape

Comparative study of current carrying capacity between 1G and 2G HTS tape samples at different temperatures and magnetic fields

The study of multiple thermal cycle of HTS YBCO bulk

Performance degradation due to thermal cycling in soldered Faraday and SuperPower HTS tape stacks

Lamination process of second generation high temperature superconducting tape at Shanghai Superconductor Technology

Examination and Analysis of Critical Current Uniformity of Long HTS Tapes by the MCorder

Numerical Study on Fault Current Characteristics of Self-Shielded HTS DC Cables Made of REBCO Tapes in Parallel With Stainless Steel Tapes

Determination of I-V Curves of HTS Tapes From The Frequency Dependent AC Transport Loss

Characterization of I-c Degradation in Bent YBCO Tapes

Delamination Properties of YBCO Tapes Under Shear Stress Along the Width Direction