High Endurance of Bipolar Resistive Switching in a Pt/LaNiO3/Nb:SrZrO3/Cu Stack: the Role of Cu Modulating Layer

F. Shao,Z. L. Lv,Z. Y. Ren,L. P. Zhang,G. L. Zhao,J. Teng,K. K. Meng,X. G. Xu,J. Miao,Y. Jiang
DOI: https://doi.org/10.1016/j.cplett.2019.137040
IF: 2.719
2019-01-01
Chemical Physics Letters
Abstract:A bipolar resistive switching characterizes in Pt/LaNiO3/0.2%Nb:SrZrO3/Cu (Pt/LNO/Nb:SZO/Cu) structure was investigated, as the Cu and LNO layers were employed as the capping and buffering layers, respectively. Interestingly, the bistable bipolar switching characteristic was achieved a high endurance performance up to 1.2 x 10(3) times at room temperature. The Cu layer was served as reservoir layer to influence the distribution of oxygen vacancies and traps inside the films, and leads to a stabilized resistive switching behavior. The Pt/LNO/Nb:SZO/Cu device with low operating voltage, high operating speed, and long retention time, exhibits a high potential in future nonvolatile memory application.
What problem does this paper attempt to address?