Abstract:This paper proposes and evaluates a novel architecture for a low-power Time-to-Digital Converter with high resolution, optimized for both integration in multichannel chips and high rate operation (40 Mconversion/s/channel). This converter is based on a three-step architecture. The first step uses a counter whereas the following ones are based on two kinds of Delay Line structures. A programmable time amplifier is used between the second and third steps to reach the final resolution of 24.4 ps in the standard mode of operation. The system makes use of common continuously stabilized master blocks that control trimmable slave blocks, in each channel, against the effects of global PVT variations. Thanks to this structure, the power consumption of a channel is considerably reduced when it does not process a hit, and limited to 2.2 mW when it processes a hit. In the 130 nm CMOS technology used for the prototype, the area of a TDC channel is only 0.051 mm2. This compactness combined with low power consumption is a key advantage for integration in multi-channel front-end chips. The performance of this new structure has been evaluated on prototype chips. Measurements show excellent timing performance over a wide range of operating temperatures (-40°C to 60°C) in agreement with our expectations. For example, the measured timing integral nonlinearity is better than 1 LSB (25 ps) and the overall timing precision is better than 21 ps RMS.

A 5-Bit, 87-Fs Step, Constant-Slope, Charge-Sharing-Based Encoding Digital-to-Time Converter in 130nm CMOS

A 10-Bit 563-Fs Step Constant-Slope Digital-to-Time Converter in 40-Nm CMOS with Nonlinearity Cancellation and Range Extension Techniques

A 12-Bit 2.5 GHz 0.37Ps-Peak-inl Digital-to-Time Converter with Parasitic-Insensitive Charge-Based Phase Interpolator

A Two-Step Time-to-Digital Converter with 5.6ps Resolution and 1 - 4255μs Measurement Range

Design of a High Speed Low Power Time-to-Digital Converter Based on Multi-stage Amplification Structure

A high precision, high linearity 10 bit Digital-to-Time Converter circuit.

A 1.3mW 8-bit Two-step Time-to-Digital Converter

A 8bits, 6.2ps Resolution Two-Step Time-to-digital Converter with Set-Reset-based Arbiters and Signal Tracking Mechanism

A 108fsrms 0.45mW 100MS/s 1.25MHz bandwidth multi-bit ΔΣ time-to-digital converter with dynamic element matching

A 1ps Resolution Two-Step Time-to-digital Converter Using Parallel Digital-to-time Converters

A low-power coarse-fine time-to-digital converter in 65nm CMOS

A Three-Step Multi-Resolution Time-to-Digital Converter.

A 108fs(Rms) 0.45mw 100ms/S 1.25mhz Bandwidth Multi-Bit Delta Sigma Time-To-Digital Converter With Dynamic Element Matching

A 3-step Low-latency Low-Power Multichannel Time-to-Digital Converter based on Time Residual Amplifier

A 150 MS/s 10-Bit CMOS Pipelined Subranging ADC with Time Constant Reduction Technique.

A Highly Linear 5gs/s Voltage-to-time Converter for Time-Based Analog-to-digital Converters

A Time-to-Digital Converter for Low-Power Consumption Single Slope Analog-to-Digital Converters in a High-Speed CMOS Image Sensor

A 10b, 0.7ps resolution coarse-fine time-to-digital converter in 65nm CMOS using a time residue amplifier

A High-Resolution Time-To-Digital Converter Based on Parallel Delay Elements

A 108fs<sub>rms</sub> 0.45mW 100MS/s 1.25MHz bandwidth multi-bit ΔΣ time-to-digital converter with dynamic element matching

A 500-MS/s 9-Bit Time-Domain ADC Using a Nonbinary Successive Approximation TDC