Abstract:This article presents a resolution-tunable time-to-digital converter (TDC) with a three-level structure, in which the low-level TDC employs an improved all-digital delay-locked loop (ADDLL) based on a cyclic pulse ring oscillator (CPRO) and a digital controller for detection lock state (DLS). Specifically, a bidirectional bypass transmission delay unit (BBTDU) in CPRO provides adjustable resolution with a 15 ps coarse delay step and a 3.5 ps fine delay step. Second, a data processing approach is presented to open the window to extract a 4-bit binary data of the bidirectional serial shift register line (BSSRL) in ADDLL for DLS and update the values of BSSRL at the same position of windowing, which can reduce the number of manipulated registers in BSSRL by approximately 93.7%. Then, a methodology of detecting the locking pattern between lock and unlock and selecting the fixed optimal windowing sequence to update the controlling values of BSSRL is proposed to eliminate dithering in a locked state, which can reduce the clock phase jitter when locked. Finally, the proposed TDC has been integrated into a system-on-chip (SoC) and fabricated in 65-nm CMOS technology. The measurement results implemented with a 30 MHz reference clock demonstrate that a resolution-tunable TDC with low power has been obtained. There are six configurable resolutions in all. When configured to a minimum resolution of 7.78 ps, the power consumption and the precision are 4.812 mW and 3.02 ps, respectively. While configured for a maximum resolution of 29.7 ps, the power consumption and the precision are 2.874 mW and 13.2 ps, respectively. The proposed TDC is extremely flexible and well-suited for integration into other large-scale application-specific integrated circuit (ASIC) chips to extend the application range, especially for low-frequency applications.

A High-Resolution Time-To-Digital Converter Based on Parallel Delay Elements

A Two-Step Time-to-Digital Converter with 5.6ps Resolution and 1 - 4255μs Measurement Range

A 1ps Resolution Two-Step Time-to-digital Converter Using Parallel Digital-to-time Converters

A High Resolution Time-to-Digital Converter (TDC) Based on Self-Calibrated Digital-to-Time Converter (DTC).

A Three-Step Multi-Resolution Time-to-Digital Converter.

A 1.3mW 8-bit Two-step Time-to-Digital Converter

A low-power coarse-fine time-to-digital converter in 65nm CMOS

A Vernier Time-to-Digital Converter with 1.5ps Resolution for an All-Digital Phase Locked Loop in 28nm CMOS.

Two-Stage Vernier-Based Time-to-Digital Converter with Enhanced Resolution and Digital Error Correction

A 8bits, 6.2ps Resolution Two-Step Time-to-digital Converter with Set-Reset-based Arbiters and Signal Tracking Mechanism

A High Resolution Time-to-digital-convertor Based on a Carry-Chain and DSP48E1 Adders in a 28-Nm Field-Programmable-gate-array

A 3-step Low-latency Low-Power Multichannel Time-to-Digital Converter based on Time Residual Amplifier

A Resolution-Tunable Low Power Time-to-Digital Converter With an Improved ADDLL Based on a Cyclic Pulse Ring Oscillator

A 10b, 0.7ps resolution coarse-fine time-to-digital converter in 65nm CMOS using a time residue amplifier

Design of a High Speed Low Power Time-to-Digital Converter Based on Multi-stage Amplification Structure

A High-Resolution TDC Design Based on Multistep Fine Time Measurement by Utilizing Delay-Adjustable Looped Carry Chains on FPGAs

A 108fsrms 0.45mW 100MS/s 1.25MHz bandwidth multi-bit ΔΣ time-to-digital converter with dynamic element matching

Time-to-digital Converter for Frequency Synthesis in 0.18 Μm CMOS

A Low Power Tdc With 0.5ps Resolution For Adpll In 40nm Cmos

Photonic-Assisted Time-Interleaved Adc Based on Optical Delay Line

High-Resolution, Multi-Channel FPGA-Based Time-to-Digital Converter