A 48 Pw, 0.34 V, 0.019%/V Line Sensitivity Self-Biased Subthreshold Voltage Reference with DIBL Effect Compensation

Yuwei Wang,Quan Sun,Hongrui Luo,Xiaofei Wang,Ruizhi Zhang,Hong Zhang
DOI: https://doi.org/10.1109/tcsi.2019.2946680
2019-01-01
IEEE Transactions on Circuits and Systems I Regular Papers
Abstract:This paper presents a self-biased subthreshold CMOS voltage reference for low-power and low-voltage applications. To achieve near-zero line sensitivity and high PSRR, a compensation structure utilizing the drain-induced-barrier-lowering (DIBL) effect is proposed to sink a supply dependent current from the output branch of a self-biased CMOS reference, which cancels the bias current's dependence on the supply voltage due to the DIBL effect. Fabricated in a 0.18- $\mu \text{m}$ CMOS technology, the measurement results demonstrate that the proposed circuit could operate under a minimum supply voltage of 0.34 V and generate a reference voltage of 147 mV, while consuming only 48 pW power. The PSRRs measured at 1 Hz and 10 kHz are -70.6 dB and -50.2 dB, respectively. For 39 measured samples, the mean line sensitivity is 0.019& x0025;/V in a supply voltage range from 0.34 to 1.8 V, and the average temperature coefficients before and after trimming are 64.81 and 10.06 ppm/& x00B0;C in 0 & x007E; 100 & x00B0;C temperature range, respectively. The total area of the voltage reference circuit is 0.0332mm(2).
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