Anomalous Hall effect of MnBi films with perpendicular magnetic anisotropy

M. Tang,Q. L. Wang,S. M. Zhou,W. J. Fan,X. P. Qiu
DOI: https://doi.org/10.1016/j.jallcom.2019.153080
IF: 6.2
2020-01-01
Journal of Alloys and Compounds
Abstract:A series of MnBi films with different Mn atomic concentrations (x) are fabricated by DC magnetron sputtering on glass substrates. The crystalline structure, the magnetic properties, and the anomalous Hall effect (AHE) are investigated as a function of x. The coercivity is found to change non-monotonically as a function of x and achieves a minimum value when x = 0.60. The residual resistivity of MnBi films also has a minimum at x = 0.60. The phonon induced skew scattering parameter in the AHE is negative and increases in magnitude with increasing x while the residual resistivity induced skew scattering parameter changes the sign from positive to negative. The scattering independent parameter b is positive and increases with increasing x. The AHE behavior can be attributed to the evolution of the microstructure with x. (C) 2019 Elsevier B.V. All rights reserved.
What problem does this paper attempt to address?