3D Electronics: 3D Sidewall Integration of Ultrahigh‐Density Silicon Nanowires for Stacked Channel Electronics (adv. Electron. Mater. 7/2019)

Xiaoxiang Wu,Haiguang Ma,Han Yin,Danfeng Pan,Junzhuan Wang,Linwei Yu,Jun Xu,Yi Shi,Kunji Chen
DOI: https://doi.org/10.1002/aelm.201970034
IF: 6.2
2019-01-01
Advanced Electronic Materials
Abstract:In article number 1800627, Kunji Chen and co-workers demonstrate 3D sidewall growth and integration of ultra-long parallel silicon nanowires along oblique and vertical grooves. This procedure enables reliable low-temperature fabrication of multilevel stacked-channel field effect transistors. Such transistors demonstrate high Ion/Ioff current ratio >107 and rather low leakage current, paving the way for the construction of more advanced 3D electronics.
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