A 0.75 V Reference Clamping Sense Amplifier for Low-Power High-Density ReRAM with Dynamic Pre-Charge Technique

Jiahao Yin,Chunmeng Dou,Danian Dong,Jie Yu,Xiaoxin Xu,Qing Luo,Tiancheng Gong,Lu Tai,Peng Yuan,Xiaoyong Xue,Ming Liu,Hangbing Lv
DOI: https://doi.org/10.1587/elex.16.20190201
2019-01-01
IEICE Electronics Express
Abstract:There are two major challenges in developing the sensing circuit for ReRAM in deep submicron technologies, including: 1) the reduced sensing margin (SM) due to the lowered supply voltage (VDD). 2) the degraded read access pass yield caused by the increased process-voltage-temperature (PVT) variations. A Reference Clamping Sense Amplifier (RC-CSA) with Amplifier Assisted load PMOS and Dynamic Pre-charge circuit is proposed to deal with these two challenges. Simulation results show that the RC-CSA is able to provide over 200mV SM with VDD down to 0.55V, and capable to work with a large bit-line loading (4096 cells per BL). The typical read yield is 99.9% for 32-Mb macro with sensing time of 4.6 ns under 0.75V VDD. Overall, RC-CSA is very suitable for low-VDD and high-density applications.
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