A Novel Read Circuit for RRAM Based on RC Delay Effect

Jiabao Ye,Xuecheng Cui,Haoxiong Bi,Jifang Cao,Wannian Wang,Xiaoxin Xu,Dong Liu,Bing Chen
DOI: https://doi.org/10.1049/ell2.12964
2023-01-01
Electronics Letters
Abstract:In this paper, a novel Resistive Random-Access Memory (RRAM) read circuit has been designed and verified by simulation based on the RRAM model and parasitic capacitance of the circuit. Simulation results demonstrate the feasibility and effectiveness of the proposed circuit, with accurate reading of RRAM states and fast reading speed in the nanosecond range. The sense margin of the proposed circuit has improved as the array size increases, enhancing its application for advanced node RRAM array manufacture. Compared with conventional circuits, the proposed circuit achieved power consumption reduction of 6% and area reduction of 46.9 um2, resulting in a 97.5% reduction in area, providing an effective solution to address the cost and chip size challenges associated with RRAM industrialization. The authors proposed a novel read circuit for Resistive Random-Access Memory (RRAM) based on the RC delay effect. Compared with conventional circuits, the proposed circuit achieved power consumption reduction of 6% and area reduction of 46.9 um2, providing an effective solution to address the cost and chip size challenges associated with RRAM industrialization.image
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