Contribution of Quantum Susceptance in SIS Junction Capacitance Measurement

Takaftuni Kojima,Matthias Kroug,Yoshinori Uzawa,Yuto Kozuki,Wenlei Shan
DOI: https://doi.org/10.1109/tasc.2019.2908092
IF: 1.9489
2019-01-01
IEEE Transactions on Applied Superconductivity
Abstract:In this paper, we present an investigation of the contribution of quantum susceptance in capacitance measurements of superconductor-insulator-superconductor tunnel junctions. We directly measured the one-port S-parameter S-11 by utilizing a 4-K probe station in combination with a network analyzer. We observed a bias voltage dependence of the measured junction susceptance which demonstrates the contribution of quantum susceptance. Calculation results performed, based on a simple equivalent circuit model, were in excellent agreement with the measurements. Experiment and analysis methods suggested here enable the quantitative verification of the contribution of quantum susceptance and are an effective way of extracting the junction's geometric capacitance.
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