CIRCUITS FOR STATISTICAL MEASUREMENT OF QUANTUM STATES

吉争鸣,孙国柱,范世雄,杨名,许伟伟,吴培亨
DOI: https://doi.org/10.3969/j.issn.1000-3258.2003.z2.002
2003-01-01
Abstract:We discuss the quantum characteristics of superconductor tunneling junction (SIS) during its transition from zero voltage state to normal state. The feasibility for statistical measurement of the switch current is studied. Because the switch current is very sensitive to the temperature and the current quantum-escaping rate is very small, high stability for temperature and high-resolution measurement is needed. We developed a circuit to get the statistical characteristics of SIS junction′s critical current. This circuit is based on measuring the time span instead of measuring the critical current of SIS junction itself. Our simulations by computer prove that such a circuit has higher resolution. Experiments on the circuit are undergoing.
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